High Resolution Micro Computed Tomography System

The Zeiss Versa 610 is an X-ray microscope (XRM) that provides high-resolution images of internal structures in a sample using a non-destructive method. The capabilities of the XRM make it a valuable tool for scientific exploration and analysis across multiple disciplines – for example, geological samples of rock and soil; biological samples of bone and other tissue and organisms; material science study of metals, polymer, ceramics, and composites.

Location: University Instrumentation Center, University of New Hampshire, Durham NH

Manufacturer: Zeiss

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Contact: Nancy Cherim
Nancy.Cherim@unh.edu