Depth Profiling

Resource Instrument/Equipment Location Scientific Area
X-Ray Photoelectron Spectrometer
The Kratos Supra is an X-Ray Photoelectron Spectrometer (XPS) that can provide highly accurate and fast acquisition of data for elemental analysis and...
Analysis Type: Depth Profiling, Elemental Analysis, Quantification, Surface Analysis
 Spectrometer/Spectrophotometer University of New Hampshire - Durham Biology/Biomedical, Chemical Engineering, Chemistry, Civil Engineering, Electrical Engineering, Engineering, Geology, Material Science, Mechanical Engineering