Elemental Analysis

Instrument/Equipment

Location

Scientific Area

Analysis Type

Keyword

Resource	Instrument/Equipment	Location	Scientific Area
Agilent 5800 VDV ICP-OES A dual-view inductively coupled plasma optical emission spectrometer designed for fast, high-throughput multi-element water, environmental, geological... Analysis Type: Elemental Analysis, Quantification, Spectrometry	Spectrometer/Spectrophotometer	University of New Hampshire - Durham	Chemical Engineering, Chemistry, Engineering, Geology
ICP-MS Triple Quadrupole inductively Coupled Plasma Mass Spectrometer for elemental analysis of liquid and solid samples. Analysis Type: Elemental Analysis, Measurement, Separation, Spectrometry	ICP-MS	Dartmouth College - Hanover	Biology/Biomedical, Chemical Engineering, Chemistry, Environmental, Geology, Material Science, Plant Sciences
(Scanning) Transmission Electron Microscope Talos F200i (S)TEM Analysis Type: Diffraction, Elemental Analysis, Imaging, Measurement	Electron Microscope, Spectrometer/Spectrophotometer	Dartmouth College - Hanover	Biology/Biomedical, Chemical Engineering, Chemistry, Civil Engineering, Electrical Engineering, Engineering, Geology, Material Science, Mechanical Engineering, Physics
Dual Beam. Scanning Electron Microscope / Focused Ion Beam Helios 5 CX Dual Beam Analysis Type: Elemental Analysis, Imaging, Measurement	Electron Microscope, Spectrometer/Spectrophotometer	Dartmouth College - Hanover	Biology/Biomedical, Chemical Engineering, Chemistry, Civil Engineering, Electrical Engineering, Engineering, Geology, Material Science, Mechanical Engineering, Physics
X-Ray Photoelectron Spectrometer The Kratos Supra is an X-Ray Photoelectron Spectrometer (XPS) that can provide highly accurate and fast acquisition of data for elemental analysis and... Analysis Type: Depth Profiling, Elemental Analysis, Quantification, Surface Analysis	Spectrometer/Spectrophotometer	University of New Hampshire - Durham	Biology/Biomedical, Chemical Engineering, Chemistry, Civil Engineering, Electrical Engineering, Engineering, Geology, Material Science, Mechanical Engineering
Scanning Electron Microscope - FIB SEM/EDS The Tescan Lyra 3GMU FIB Scanning Electron Microscope (SEM) is a dual beam field emission microscope.<br /> <br /> In addition to standard SEM imagi... Analysis Type: Elemental Analysis, Imaging, Measurement, Quantification, Spectroscopy	Electron Microscope, Microscope/Imaging System, Spectrometer/Spectrophotometer	University of New Hampshire - Durham	Biology/Biomedical, Chemical Engineering, Chemistry, Civil Engineering, Electrical Engineering, Engineering, Geology, Material Science, Mechanical Engineering, Physics